Coupling simulation and accelerated degradation model for reliability estimation: Application to a voltage regulator

This paper demonstrates the use of numerical simulation data, depending on behavior a low voltage dropout regulator, for reliability performance estimation based accelerated degradation test data. The regulator was designed using Cadence Virtuoso software in 180 nm AMS CMOS technology, and simulated to evaluate its output variations both temperature input voltage. data were generated according environmental parameters (input temperature) constraints, which makes it possible define failure thresholds under conditions, making model along with proposed model. Degradation path has been adopted determine pseudo time specified criterion (5 %). Acceleration law then derived estimate by performing maximum likelihood method not only analyse but also predict lifetime distribution different stress conditions.